Science and Engineering

This section is dedicated to Time of flight-secondary ion mass spectrometry (TOF-SIMS)

The Fourier Transform Infrared spectroscopy technique uses the mid-infrared to reveal the bonding in organic molecules as well as the presence of functional groups across a range of different sample types.

The UV-vis-NIR Spectrophotometer technique measures absorption, transmittance or reflectance of UV, visible and near-infrared light in a variety of liquid and solid samples.

On this course you will gain practical experience using our advanced X-ray diffractometer, including the key knowledge required to analyse and interpret the results obtained from experimental setup to determining crystallographic information using common XRD software.

This is a course to teach you the core concepts behind common materials characterisation methods used to understand the properties and structures of materials.