11 May 2026
Location: In person
Duration: 3 days
Type: Short Course

Course Overview

X-Ray techniques provide a powerful non-destructive method for the investigation of a materials composition and surface structure.

On this course you will gain practical experience using our advanced X-ray diffractometer, including the key knowledge required to analyse and interpret the results obtained from experimental setup to determining crystallographic information using common XRD software.

Dr Lorna Anguilano

Image of Dr Lorna Anguilano

Dr Lorna Anguilano is the Director of the ETC and her background is in applied mineralogy with a PhD in Archaeometallurgy and a wide experience of material characterisation through X-Ray Diffraction, X-Ray Fluorescence, Scanning Electron Microscopy and Electron Back-Scattering Diffraction. She provides consultancy in material characterisation and failure’s diagnosis as well as actively generates and develops research in materials characterisation and development.

Dr Sophia Haghani

Image of Dr Sophia Haghani

Dr Sophia Haghani is a chartered scientist and deputy Quality Manager of accreditation at the ETC. She has extensive experience in material characterisation through X-Ray Diffraction, Scanning Electron Microscopy, and X-Ray Fluorescence. She provides consultancy in material characterisation and material development. She is also a fellow of Higher Education Academy, with teaching experience in material characterisation techniques, water infrastructures and sea level change.

Much of the XRD course will be spent on the interpretation of the data obtained by such a technique. The practicalities will still be covered, from the sample preparation to loading a running the instrumentation, though actually operation of a diffractometer is relatively simple. The key to getting the most out of the technique is in that interpretation, matching the peaks to crystalline phases and what the spectra obtained tells you about your material. There is much to potentially be learned from the results and giving you the core considerations in understanding XRD spectra is at the heart of this workshop. Broadly the areas that will be covered are:

• X-ray diffraction basic concepts: Fundamental theory of crystal structures and types, how they are defined included Miller indices, plus diffraction phenomenon, Bragg's law and typical applications of XRD

• Practicalities of X-ray diffraction: Sample preparation and loading, analysis considerations, influence of sample morphology, obtaining diffraction patterns and getting good data

• Interpretation of spectra: Using common software such as TOPAS, GSAS 2 and MAUD, tips and tricks

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Price: £4,320.00