Location: Online
Course type: Self paced

This section is dedicated to Time of flight-secondary ion mass spectrometry (TOF-SIMS)

Mass-spectrometry is a wide range techniques which can yield chemical information from samples. The TOF-SIMS is one type of mass spectrometer which is specifically used to gain atomic compositional information from the surface of a sample or from a prepared cross-section of a sample, even at trace levels.

Dr.UcheOnwukwe

Uche is a researcher with a background in Materials Science and a PhD in biomimetics towards the green synthesis of functional materials. They have extensive experience in the use of various characterisation techniques including electron microscopy (TEM and SEM), various spectroscopic techniques (Raman, FTIR, UV-VIS-NIR), a range of X-Ray techniques (XRF, XRD) and an understanding of the use of different thermal techniques.

  • Introduce the technique of mass-spectrometry
  • Identify possible applications for the technique
  • Give some indications for the preparation of samples for MS.
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Price: £200.00